IN THIS ISSUE Rietveld Refinement from Powder Diffraction Data

نویسندگان

  • Paolo Scardi
  • Ian Madsen
  • Takuji Ikeda
  • Juan Rodríguez-Carvajal
  • Ian C. Madsen
  • Michal Dušek
  • Václav Petricek
  • Markus Wunschel
  • Robert E. Dinnebier
  • Sander van Smaalen
چکیده

CPD chairman’s message, Paolo Scardi 2 CPD projects: 2 Quantitative Phase Analysis RR, Ian Madsen Editor’s message, Robert Dinnebier 2 Thirty five years ago, Hugo Rietveld 3 WWW sites related to Powder Diffraction 5 IUCr Commission on Powder Diffraction 5 Rietveld Refinement from Powder Diffraction Data Beyond the abilities of Rietveld analysis: MEM-based pattern fitting with synchrotron X-ray powder diffraction data 7 Fujio Izumi and Takuji Ikeda Anisotropic Peak Broadening in High Resolution Data on RbC60 9 Peter W. Stephens and Ashfia Huq Recent developments of the program FULLPROF 12 Juan Rodríguez-Carvajal Rietveld Refinement and Beyond 20 David E. Cox Accuracy In X-ray Powder Diffraction: A Comparison of Quantitative Methods 21 Nicola V.Y. Scarlett and Ian C. Madsen Internet Available Rietveld Software 24 Lachlan M. D. Cranswick Dealing with unknown impurity phases 30 W.I.F. David Rietveld refinements with JANA2000 32 Michal Dušek, Václav Petricek, Markus Wunschel, Robert E. Dinnebier and Sander van Smaalen

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تاریخ انتشار 2001